On the Fault Testing for Reversible Circuits

نویسندگان

  • Satoshi Tayu
  • Shigeru Ito
  • Shuichi Ueno
چکیده

This paper shows that it is NP-hard to generate a minimum complete test set for stuck-at faults on the wires of a reversible circuit. We also show non-trivial lower bounds for the size of a minimum complete test set.

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تاریخ انتشار 2007